Highly Accelerated Life Testing (HALT) is a process that uses rapid high‑low temperature cycling shock systems to expose design defects and weaknesses in electronic and mechanical assemblies. The purpose of HALT is to identify the functional and destructive limits of products in the early stage of product development, so as to optimize product reliability.
No pre‑defined limits are set for HALT; the limits are determined by the product itself. Stress is increased step‑by‑step until failure occurs, and the product shall be monitored throughout the test.
Highly Accelerated Stress Screening (HASS) is performed after the operating or destructive limits are obtained from HALT, with applied stress levels lower than those used in HALT.
Model: Hast‑250, Hast‑350, Hast‑450
Inner chamber size (mm): Φ250×D400, Φ350×D500, Φ450×D600
Outer chamber size (mm): W560×H450×D850, W560×H450×D850, W560×H450×D850
Temperature range: 100℃～132℃
Humidity range: Saturated steam (RH)
Pressure range: Ambient atmospheric pressure + 0～4 kg/cm²
Circulation mode: Natural convection circulation of water‑vapor
Timer range: 0～999 Hr
Pressurization time: Approx. 45 minutes from 0.00 Kg/cm² to 2.00 Kg/cm²
